Torthaí cuardaigh - Neděla V.

  • 1 - 3 toradh as 3 á dtaispeáint
Beachtaigh na torthaí
  1. 1
    The Impact of Critical Flow on the Primary Electron Beam Passage through Differentially Pumped Chamber

    The Impact of Critical Flow on the Primary Electron Beam Passage through Differentially Pumped Chamber

    Rannpháirtithe:
    The Impact of Critical Flow on the Primary Electron Beam Passage through Differentially Pumped Chamber
    LEABHAR
    Cuir le mo chuid Ceanán
    Sábháilte in:
  2. 2
    Apertures with Laval Nozzle and Circular Orifice in Secondary Electron Detector for Environmental Scanning Electron Microscope

    Apertures with Laval Nozzle and Circular Orifice in Secondary Electron Detector for Environmental Scanning Electron Microscope

    Rannpháirtithe:
    Apertures with Laval Nozzle and Circular Orifice in Secondary Electron Detector for Environmental Scanning Electron Microscope
    LEABHAR
    Cuir le mo chuid Ceanán
    Sábháilte in:
  3. 3
    Analysis of Gas Flow in a Secondary Electron Scintillation Detector for ESEM with a New System of Pressure Limiting Apertures

    Analysis of Gas Flow in a Secondary Electron Scintillation Detector for ESEM with a New System of Pressure Limiting Apertures

    Rannpháirtithe:
    Analysis of Gas Flow in a Secondary Electron Scintillation Detector for ESEM with a New System of Pressure Limiting Apertures
    LEABHAR
    Cuir le mo chuid Ceanán
    Sábháilte in:

Uirlisí cuardaigh: