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1
The Impact of Critical Flow on the Primary Electron Beam Passage through Differentially Pumped Chamber
Weitere Verfasser:Signatur: Wird geladen …The Impact of Critical Flow on the Primary Electron Beam Passage through Differentially Pumped Chamber
Standort: Wird geladen …
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2
Apertures with Laval Nozzle and Circular Orifice in Secondary Electron Detector for Environmental Scanning Electron Microscope
Weitere Verfasser:Signatur: Wird geladen …Apertures with Laval Nozzle and Circular Orifice in Secondary Electron Detector for Environmental Scanning Electron Microscope
Standort: Wird geladen …
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3
Analysis of Gas Flow in a Secondary Electron Scintillation Detector for ESEM with a New System of Pressure Limiting Apertures
Weitere Verfasser:Signatur: Wird geladen …Analysis of Gas Flow in a Secondary Electron Scintillation Detector for ESEM with a New System of Pressure Limiting Apertures
Standort: Wird geladen …
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Suchwerkzeuge:
Ähnliche Schlagworte
Electron microscopy
Microscopia electrn̤ica
Alta presin̤
CAE
High pressure
SolidWorks
Ansys
Apertura
Aperture
CFD
Cinťica
Cm̀ara de bombeo diferencial39-46
Cosmos
Detector de centelleo de electrones
Differentially Pumped Chamber
Digital computer simulation
Dinm̀ica de fluidos
EREM
ESEM
Espectrometra̕ de rayos gamma
FEI
Fluid dynamics
Fluid mechanics
Gamma ray spectrometry
Gamma rays
Kinetics
Laval nozzle
Mach number
Mecǹica de fluidos
Rayos gamma