Techniques for Studying Materials, Transmission Electron Microscopy
Este conjunto de animaciones ayuda a entender los principios de la microscopa̕ electrn̤ica de transmisin̤. Est ̀compuesto por los siguientes elementos:A typical TEM systemElectron source of TEMTEM condenser systemFormation of an image by ray diagramsSpherical and chromatic aberrationCondenser lenses...
Gespeichert in:
| Weitere Verfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Schlagworte: | |
| Online-Zugang: | Techniques for Studying Materials, Transmission Electron Microscopy |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
MARC
| LEADER | 00000nam a22000004a 4500 | ||
|---|---|---|---|
| 001 | vpro10257 | ||
| 005 | 20201223000000.0 | ||
| 008 | 160716s2016 ck # g## #001 0#eng#d | ||
| 020 | |||
| 022 | |||
| 040 | |a CO-BoINGC | ||
| 041 | 0 | |a eng | |
| 245 | 1 | 0 | |a Techniques for Studying Materials, Transmission Electron Microscopy |
| 246 | |a Tčnicas para estudiar materiales: microscopa̕ electrn̤ica de transmisin̤ | ||
| 264 | |a Bogot ̀(Colombia) : |b Revista VirtualPRO, |c 2016 | ||
| 520 | 3 | |a Este conjunto de animaciones ayuda a entender los principios de la microscopa̕ electrn̤ica de transmisin̤. Est ̀compuesto por los siguientes elementos:A typical TEM systemElectron source of TEMTEM condenser systemFormation of an image by ray diagramsSpherical and chromatic aberrationCondenser lenses in TEM: convergenceTEM: imaging and diffractionTEM projection systemParts of a STEM microscope | |
| 650 | \ | \ | |a Materiales |
| 650 | \ | \ | |a TecnologƯ̕a de los materiales |
| 650 | \ | \ | |a Materials |
| 650 | \ | \ | |a Materials engineering |
| 650 | \ | \ | |a ciencia de materiales |
| 650 | \ | \ | |a microscopa̕ electrn̤ica de transmisin̤ |
| 650 | \ | \ | |a aberracin̤ cromt̀ica |
| 650 | \ | \ | |a aberracin̤ esfřica |
| 650 | \ | \ | |a diagramas de rayos |
| 650 | \ | \ | |a lentes |
| 650 | \ | \ | |a convergencia |
| 650 | \ | \ | |a difraccin̤ |
| 650 | \ | \ | |a proyeccin̤ |
| 650 | \ | \ | |a materials science |
| 650 | \ | \ | |a transmission electronic microscopy |
| 650 | \ | \ | |a chromatic aberration |
| 650 | \ | \ | |a spherical aberration |
| 650 | \ | \ | |a ray diagrams |
| 650 | \ | \ | |a lenses |
| 650 | \ | \ | |a convergence |
| 650 | \ | \ | |a diffraction |
| 650 | \ | \ | |a imaging |
| 700 | \ | \ | |a Goodhew Peter J. |
| 700 | \ | \ | |a Chivall James |
| 700 | \ | \ | |a DoITPoMS, University of Cambridge |
| 856 | |z Techniques for Studying Materials, Transmission Electron Microscopy |u https://virtualpro.unach.elogim.com/biblioteca/tecnicas-para-estudiar-materiales-microscopia-electronica-de-transmision | ||